Faster Trace Fewer Pins
Ideal for collecting large amounts of trace data where SoC pin count rules out parallel trace. Captures multiple lanes of high-speed serial trace (HSSTP) to enable software analysis.
User I/O port offers scripting capabilities and 8 digital I/O pins to enable automated testing and validation workflows.
Add device specific registers, view instruction and data trace history, customize connections for device-specific registers, bring targets out of reset, and much more.
Code download speeds up to 12 MB per second and JTAG rates up to 180 MHz. SWD rates up to 125MHz can dramatically shorten debug cycles on single or multi-core devices.
Remote gigabit ethernet or USB 3.0 host connections for remote and fast accessibility.
Capture extensive serial trace data supporting up to 6 lanes and 12.5 Gbps. Single-lane line rates stored into an 8GB on-probe trace store.
Works with complex SoC configurations to enable trace data capture for Arm CoreSight Macrocells, such as ETM, PTM, ITM and STM.
Arm Development Studio
An end-to-end software development environment for all Arm-based systems, including Arm Compiler, debuggers, IDEs, performance analysis tools, models and middleware.
Second-generation high-performance debug probe, enabling maximum visibility into Arm processors with 2.4 Gbps parallel trace over 4 pins. Streams trace data directly to host PC, and includes system auto-detection with Arm Development Studio and a wide range of target connectors.
Second-generation high-performance debug and trace probe, enabling debug and widest bandwidth parallel trace up to 19.2 Gbps over 32 pins. Includes an 8 GB trace buffer, real-time dynamic monitoring, and system autodetection with Arm Development Studio, plus a range of target connectors, including JTAG, MICTOR, CoreSight and MIPI.