ARM’s highest performing processor, extending the capabilities of mobile and enterprise computing. Read More...
The SCANFLEX hardware was the first fully modular JTAG/Boundary Scan platform on the market and is still the most modern system architecture available to date.
It consists essentially of three components: controllers, TAP transceivers and I/O modules.
The Controllers are available in three performance classes and can be configured
The TAP Transceivers are the front end facing the unit under test, while controllers are the back end. They are available in various form factors to address even the most diverse application environments.
Adaptable TAP transceivers are particularly flexible due to TAP Interface Cards" (TICs), which can be plugged either internally or externally. External plugging requires TIC Extension Modules (TEMs). We are continuously expanding our TIC portfolio and ensure that all types, being equipped with slots, can be freely combined. TAP transceivers typically come in two product versions and with permanently installed TICs and TEMs.
I/O modules are the third element of the SCANFLEX principle. A broad range of independently selectable modules with numerous test functions (analog/digital/mixed signal) is available. At the same time, in many modules the VarioCore technology ensures dynamic re-configurability of the active test functions on the basis of software-defined intellectual property (IP).
PXI is one of the most important integration platforms for current test systems. To supplement the SCANFLEX controllers, a range of digital I/O modules are available: these modules make it possible to combine JTAG/Boundary Scan technology with functional tests for single-ended and differential-ended I/Os. Moreover, the I/O channels can be easily integrated into the Boundary Scan test procedures (e.g. interconnection test). The range of I/O modules comprises pure software-driven I/O modules as well as modules for dynamic functional testing of up to 100 MHz and Mbit memory behind the pin.