
PathFinder is the industry’s first comprehensive layout-based electro-static discharge (ESD) integrity solution targeted to address the increasing reliability challenges faced by nanometer designs. PathFinder’s integrated modeling, extraction, and simulation capabilities enables automated and exhaustive analysis of the entire IC, highlighting weaknesses in the design that can be susceptible to failure caused by an ESD event. It also provides innovative transistor-level dynamic ESD capabilities for validation of I/O, analog, and mixed-signal macro designs. From early prototyping to sign-off, designers can use PathFinder to identify the most vulnerable area of the design, meet ESD guidelines, and improve product yield.