ARM’s highest performing processor, extending the capabilities of mobile and enterprise computing. Read More...
- Automated module/unit test of embedded software
- Test data management
- C1 coverage
- Test planning tool CTE integrated
- Test documentation
- Seamless integration with HiTOP, the Hitex debugger for ARM
- Tests can be executed in conjunction with the Hitex simulator for ARM on the PC or with Tanto or Tantino on the real target system
Tessy's Basic Functionality
Tessy automates dynamic unit tests of embedded software written for the ARM family of microcontrollers. Tessy analyzes the source code and builds a test driver for the function to be tested. Test input data and expected output data is entered in Tessy. Then the test application is compiled using a cross compiler for the ARM family of microcontrollers. Using the test and analysis tool Tantino or Tanto for ARM from Hitex, the test application is loaded into the target system and executed in real-time. If the units do not require the target the tests can be also performed on the PC in conjunction with the Hitex Simulator for ARM.
Tessy tests single units (i.e. functions) of the application separately and intensively. Test data is saved for future regression testing.
Regression testing repeats previous successful tests to assure that optimizations, bug-fixes, etc. do not introduce side effects. Regression testing is a key to software quality. Tessy is especially well-suited for automated regression testing.
Tessy includes the Classification tree Editor (CTE), a tool supporting the Classification Tree Method. This method transforms systematically a problem specification into a complete set of non-redundant, error-sensitive test case specifications. Planning tests in advance is a key to software quality.
The seamless integration of Tessy with HiTOP, the ARM debugger from Hitex, allows to switch comfortable from testing to debugging.