
Tessent TestKompress is an industry-leading automatic test pattern generation (ATPG) tool that delivers high quality scan ATPG based test with the low manufacturing test cost. The foundation of TestKompress is the industry-proven ATPG engine that is able to apply all the fault models necessary for thorough silicon test. TestKompress uses a patented on-chip compression technique to create scan pattern sets that have dramatically less test data volume and reduced test time on the automatic test equipment.
Product Features
- Provides up to a 100X reduction in test data
volume and test time
-TestKompress works in all design flows
- Supports all ATPG fault models and pattern
types, including stuck-at, IDDQ, transition
and path-delay for at-speed test
- Supports low pin count testing schemes to reduce
top level routing, minimize test access and
facilitate multi-site testing
Tessent TestKompress - ATPG with Embedded Compression