ARM’s highest performing processor, extending the capabilities of mobile and enterprise computing. Read More...
Tessent TestKompress is the industry-leading automatic test pattern generation (ATPG) tool that delivers high quality scan ATPG based test with the low manufacturing test cost. The foundation of TestKompress is the industry-proven ATPG engine that is able to apply all the fault models necessary for thorough silicon test. TestKompress uses a patented on-chip compression technique to create scan pattern sets that have dramatically less test data volume and reduced test time on the automatic test equipment.
Mentor Graphics has released a TestKompress reference flow for the ARM Cortex-A15 processor. Additional reference flows in development.
- TestKompress implementation reference flow available for the Cortex-A15
- Provides up to a 100X reduction in test data volume and test time
-TestKompress works in all design flows
- Supports all ATPG fault models and pattern types, including stuck-at, IDDQ, transition and small delay for at-speed test and user-defined fault models
- Supports low pin count testing schemes to reduce top level routing, minimize test access and facilitate multi-site testing