The SpyGlass® DFT solution has the unique ability to predict ATPG (automatic test pattern generation) test coverage and pinpoint testability issues as the RTL description is developed, even before a gate-level netlist is generated. The SpyGlass DFT solution not only detects testability issues--it can also automatically correct them.
The benefits are substantial. Traditional approaches depend on test engineers to design test clocks and set/reset logic for scan insertion at the gate level, when changes can be difficult, time-consuming and expensive. The SpyGlass DFT solution, by contrast, enables users to tune testability during RTL creation, when the design impact is greatest and the cost of modifications lowest. The SpyGlass DFT solution can significantly shorten development cycles, reduce costs and improve overall testability.